Expo & Sponsorship Sales:  Schedule a Call  or  +1 707-305-1561

Side Talk: Advancements in IR Interferometry for SmallSat Optics & Optical Systems

4D Technology, an Onto Innovation subsidiary

Side Talks are 45 minute presentations and/or discussions from our exhibitors and sponsors, located in the Boole Room (near entrance).

SWIR optics play a pivotal role in the small satellite space due to their superior data transmission and imaging capabilities.
Interferometry enables precise measurement of optical wavefronts in space optics and helps maintain the integrity of the transmitted and received signals. The optical components and systems involved in transmitting, relaying, and receiving these signals must be held to tight tolerances. Alignment accuracy is critical as well, resulting in better
coupling, less loss and higher efficiencies. It is therefore essential to test the components at every operating wavelength (typically in the C-band), to understand how the beams will propagate, scatter, and fiber couple, and correct for this performance in the optical design.
Some additional challenges in qualifying space optics, where transmission occurs through the atmosphere, can include measuring in extreme and dynamic environments that introduce vibration and turbulence; environments that traditional measurement
technologies are not equipped to work in.

This talk will discuss various metrology challenges and advancements in solutions for measuring surface and transmitted wavefront error of optics and optical systems used for space applications, including measuring and aligning SWIR components and systems, large optics and long cavity measurements, in-situ and in dynamic environments, and measuring at wavelength. It will also cover the importance of measuring the roughness of these components. Excessive roughness can scatter the beam, leading to signal loss and reduced data transfer rates, lead to crosstalk between various channels, and possibly enhance thermal changes, leading to thermal stresses that can alter the optical shape.
Attendees will learn techniques for optimizing metrology of IR components given common challenges and requirements:
• Measuring despite vibration: How dynamic interferometry can enable vibration-immune testing of IR optical components and systems
• Measuring at discreet C-band frequencies: When to use a Fizeau interferometer versus a Twyman-green when measuring surface and transmitted wavefront error
• Real-time alignment, collimation, and fiber coupling of optical systems at wavelength and the impact of metrology resolution
• Measuring surface roughness in dynamic environments

Side Talk
Date: February 5, 2025 Time: 2:45 pm - 3:30 pm